High-Resolution Electron Microscopy / (Record no. 23417)

MARC details
000 -LEADER
fixed length control field 03623cam a22002774a 4500
001 - CONTROL NUMBER
control field vtls000003145
003 - CONTROL NUMBER IDENTIFIER
control field VRT
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250102224917.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 081216s2003 enka |b 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0198509154 (hbk.)
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201402040113
Level of effort used to assign nonsubject heading access points VLOAD
Level of effort used to assign subject headings 201008071059
Level of effort used to assign classification malmash
Level of effort used to assign subject headings 200812201359
Level of effort used to assign classification venkatrajand
Level of effort used to assign subject headings 200812161334
Level of effort used to assign classification Noora
-- 200812161332
-- Noora
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QH212.T7
Item number S68 2003
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Spence, John C. H.
9 (RLIN) 49420
245 10 - TITLE STATEMENT
Title High-Resolution Electron Microscopy /
Statement of responsibility, etc. John C.H. Spence.
250 ## - EDITION STATEMENT
Edition statement 3rd ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Oxford ;
-- New York :
Name of publisher, distributor, etc. Oxford University Press,
Date of publication, distribution, etc. 2003.
300 ## - PHYSICAL DESCRIPTION
Extent xvi, 401 p. :
Other physical details ill.(some col.) ;
Dimensions 24 cm.
440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Monographs on the physics and chemistry of materials
9 (RLIN) 1639
500 ## - GENERAL NOTE
General note Rev. ed. of: Experimental high-resolution electron microscopy. 2nd ed. 1988.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Preface; Acknowledgements; List of Symbols; 1. Preliminaries; 2. Electron Optics; 3. Wave Optics; 4. Coherence and Fourier Optics; 5. High-Resolution Images of Crystals and their Defects; 6. HREM in Biology, Organic Crystals and Radiation Damage; 7. Image Processing and Superresolution Schemes; 8. Stem and Z-Contrast; 9. Electron Sources and Detectors; 10. Measurement of Electron-optical Parameters Affecting High-Resolution Images; 11. Instabilities and the Microscope Environment; 12. Experimental Methods; 13. Associated Techniques; Appendix 1; Appendix 2; Appendix 3; Appendix 4; Appendix 5
520 ## - SUMMARY, ETC.
Summary, etc. The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science (where scientists strive to make new lighter, stronger, cheaper materials), and condensed matter physics (for example in the study of the new superconductors). Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work which is covered in this book. The book also shows how the ability to see atomic arrangements has helped us understand the properties of matter. This new third edition of the standard text retains the early sections on the fundamentals of electron optics, linear imaging theory with partial coherence and multiple-scattering theory.Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of the arrangement of atoms in thin crystals using a modern electron microscope. The sections on applications of atomic-resolution transmission electron microscopy (HREM) have been extensively updated, including descriptions of HREM in the semiconductor industry, superconductor research, solid state chemistry and nanoscience, as well as metallurgy, mineralogy, condensed matter physics, materials science and biology. Entirely new sections have been added on electron holography, aberration correctors, field-emission guns, imaging filters, HREM in biology and on organic crystals, super-resolution methods, Ptychography, CCD cameras and Image plates. New chapters are devoted entirely to scanning transmission electron microscopy and Z-con
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element High resolution electron microscopy.
9 (RLIN) 49421
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Spence, John C. H.
9 (RLIN) 49420
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Suppress in OPAC No
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
    Library of Congress Classification     Library Library First Floor 21/12/2024   QH212.T7 S68 2003 9842 21/12/2024 1 21/12/2024 Books
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