High-Energy Electron Diffraction and Microscopy / (Record no. 13702)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 03213cam a2200301 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | vtls000002823 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | VRT |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250102223859.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 081203s2004 enka |b 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0198500742 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] | |
| Level of rules in bibliographic description | 201402040111 |
| Level of effort used to assign nonsubject heading access points | VLOAD |
| Level of effort used to assign subject headings | 201009200933 |
| Level of effort used to assign classification | malmash |
| Level of effort used to assign subject headings | 200812151025 |
| Level of effort used to assign classification | venkatrajand |
| Level of effort used to assign subject headings | 200812031016 |
| Level of effort used to assign classification | Noora |
| -- | 200812031015 |
| -- | Noora |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | QC793.5.E628 |
| Item number | P45 2004 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Peng, L.-M. |
| 9 (RLIN) | 31751 |
| 245 10 - TITLE STATEMENT | |
| Title | High-Energy Electron Diffraction and Microscopy / |
| Statement of responsibility, etc. | L.-M. Peng, S.L. Dudarev, M.J. Whelan. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Oxford ; |
| -- | New York : |
| Name of publisher, distributor, etc. | Oxford University Press, |
| Date of publication, distribution, etc. | 2004. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xxi, 535 p. : |
| Other physical details | ill. ; |
| Dimensions | 24 cm. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Monographs on the physics and chemistry of materials ; |
| Volume/sequential designation | 61 |
| 9 (RLIN) | 1639 |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Oxford science publications |
| 9 (RLIN) | 2609 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references (p. 501-530) and index. |
| 505 ## - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 1. Basic concepts; 2. Kinematic theory; 3. Dynamical theory I - general theory; 4. Dynamical theory II - THEED; 5. Reflection high energy electron diffraction; 6. Resonance effects in diffraction; 7. Diffuse and inelastic scattering - elementary processes; 8. Diffuse and inelastric scattering - multiple scattering effects; 9. Crystal and diffraction symmetry; 10. Perturbation methods and tensor theory; 11. Digital electron microscopy; 12. Image formation and the retrieval of the wave function; 13. The atomic scattering factor and the optical potential; 14. Debye-Waller factors; 15. Some useful mathematical relations; 16. Green's functions; 17. FORTRAN listing of RHEED routines; 18. Parameterization of the atomic scattering factor |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | This book provides the reader with a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces.Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | High energy electron diffraction. |
| 9 (RLIN) | 31752 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electron microscopy. |
| 9 (RLIN) | 11280 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Materials science. |
| 9 (RLIN) | 11207 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Dudarev, S. L. |
| 9 (RLIN) | 31753 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Whelan, M. J. |
| 9 (RLIN) | 31754 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Library of Congress Classification |
| Suppress in OPAC | No |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Library of Congress Classification | Library | Library | First Floor | 21/12/2024 | QC793.5.E628 P45 2004 | 10241 | 23/02/2025 | 1 | 21/12/2024 | Books |